Subthreshold Voltage Noise Due to Channel Fluctuations in Active Neuronal Membranes.
Peter N. SteinmetzAmit ManwaniChristof KochMichael LondonIdan SegevPublished in: J. Comput. Neurosci. (2000)
Keyphrases
- field effect transistors
- low voltage
- high density
- noise level
- multi channel
- missing data
- steady state
- high voltage
- impulse response
- noisy data
- signal to noise ratio
- noise reduction
- additive noise
- power supply
- design considerations
- carrier frequency offset
- single channel
- microscopy images
- electron microscopy
- random noise
- wavelet transform
- power system