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Editorial: Special issue on 3D integrated circuits and microarchitectures.

Yuan XieJason CongPaul D. Franzon
Published in: ACM J. Emerg. Technol. Comput. Syst. (2008)
Keyphrases
  • special issue
  • integrated circuit
  • ai edam
  • international journal
  • special section
  • ecml pkdd
  • electron beam
  • applied intelligence
  • databases
  • neural network
  • e learning