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The total ionizing dose response of leading-edge FDSOI MOSFETs.

Jian WangBinhong LiYang HuangKai ZhaoFang YuQiwen ZhengQi GuoLiewei XuJ. GaoX. CaiY. Cui
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • leading edge
  • carefully selected
  • related fields
  • information systems
  • case based reasoning
  • multi disciplinary