CAREFULLY SELECTED
Experts
- Kenneth A. Ross
- Chia-An Yeh
- Richard T. Snodgrass
- Yen-Shin Lai
- Graham M. Birtwistle
- Sandeep Soni
- Shinjae Yoo
- Giovanni Breglio
- Daniele Quercia
- Jisun An
- Andrew B. Kahng
- Adolfy Hoisie
- William Kent
- Jacob Eisenstein
- Serge Abiteboul
- Yihui Ren
- George Philip
- Jon Crowcroft
- Armando Laudati
- Robert L. Glass
- Mahadev Satyanarayanan
- Kristina Lerman
- César A. Muñoz
- Tiziana Margaria
- Janis L. Gogan
- Francesco Fienga
- Baishakhi Ray
- Vincenzo Romano Marrazzo
- Ilse Ipsen
- Kang Liu
- Lukas Theisinger
- Chris Rizos
- Sunil Jacob
- Neil J. A. Sloane
- Victor M. Larios-Rosillo
- Kenneth D. Mandl
- Jian Pu
- Julia Blume
- Tilmann Rabl
Venues
- IEEE Technol. Soc. Mag.
- SIGMOD Rec.
- CoRR
- J. Autom. Reason.
- Sci. Comput. Program.
- HICSS
- IEEE Softw.
- Scientometrics
- J. Vis.
- SIGCSE
- ACM Trans. Auton. Adapt. Syst.
- IEEE Trans. Ind. Electron.
- CENTERIS/ProjMAN/HCist
- ECIS
- SIGUCCS
- WSC
- Interactions
- Middleware Posters and Demos
- ACM SIGCSE Bull.
- IT Prof.
- AMCIS
- J. Inf. Sci.
- AMIA
- CAiSE Forum (Selected Papers)
- LCN
- SIAM Rev.
- ACM SIGSOFT Softw. Eng. Notes
- APL
- DG.O
- CSIT (2)
- Comput. Ind. Eng.
- Microelectron. Reliab.
- Future Gener. Comput. Syst.
- IEEE Data Eng. Bull.
- HILT
- OSS
- IEEE Trans. Instrum. Meas.
- Computer
- TRI-Ada
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