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Image based compensation for thickness variation in microscopy section series.
Philipp Hanslovsky
John A. Bogovic
C. Shan Xu
Kenneth J. Hayworth
Zhiyuan Lu
Harald F. Hess
Stephan Saalfeld
Published in:
CoRR (2015)
Keyphrases
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image analysis
high throughput
neural network
case study
database
machine learning
e learning
pattern recognition
microscopy images