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Multi-Frequency Test Generation for Incipient Faults in Analog Circuits Based on the Aliasing Measuring Model.

Yang YuYueming JiangXiyuan Peng
Published in: IEEE Access (2018)
Keyphrases
  • test generation
  • fault diagnosis
  • genetic algorithm
  • decision making
  • conceptual model
  • database
  • data sets
  • specification language