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Effect of short circuit aging on safe operating area of SiC MOSFET.

Tien Anh NguyenStéphane LefebvreStephane Azzopardi
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • short circuit
  • thin film
  • pattern recognition
  • artificial neural networks
  • evolutionary algorithm
  • low cost
  • software aging