Distance metric learning with the Universum.
Bac NguyenCarlos MorellBernard De BaetsPublished in: Pattern Recognit. Lett. (2017)
Keyphrases
- distance metric learning
- semi supervised learning
- semi supervised
- metric learning
- maximum margin
- labeled data
- distance metric
- unlabeled data
- binary classification
- semidefinite programming
- misclassification costs
- supervised learning
- text categorization
- unsupervised learning
- active learning
- image classification
- cost sensitive
- pairwise constraints
- target domain
- machine learning
- learning problems
- transfer learning
- learning tasks
- kernel learning
- pairwise
- naive bayes
- multi label
- multi class
- support vector
- svm classifier
- kernel matrix
- dimensionality reduction
- high dimensional
- training data
- learning algorithm