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Role of Nitrogen in Suppressing Interfacial States Generation and Improving Endurance in Ferroelectric Field Effect Transistors.

Saifei DaiSongwei LiShuangshuang XuFengbin TianJunshuai ChaiJiahui DuanWenjuan XiongJinjuan XiangYanrong WangHao XuJing ZhangXiaolei WangWenwu Wang
Published in: IMW (2024)
Keyphrases
  • schottky barrier
  • field effect transistors
  • steady state
  • semiconductor devices
  • high density
  • databases
  • real world
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  • x ray