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A substrate noise analysis methodology for large-scale mixed-signal ICs.

Wen Kung ChuNishath K. VergheseHeayn-Jun CholKenji ShimazakiHiroyuki TsujikawaShouzou HiranoShirou DoushohMakoto NagataAtsushi IwataTakafumi Ohmoto
Published in: CICC (2003)
Keyphrases
  • high speed
  • digital images
  • multi view
  • signal to noise ratio
  • parallel processing