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InVerS: An Incremental Verification System with Circuit Similarity Metrics and Error Visualization.
Kai-Hui Chang
David A. Papa
Igor L. Markov
Valeria Bertacco
Published in:
ISQED (2007)
Keyphrases
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similarity metrics
similarity metric
similarity measure
model checking
data analysis
similarity measurement
error rate
high speed
similarity computation
shape similarity
asynchronous circuits
information retrieval