SIMILARITY MEASUREMENT
Experts
- Gonzalo Navarro
- Caetano Traina Jr.
- Paul M. B. Vitányi
- Dong Kyue Kim
- Szymon Grabowski
- Travis Gagie
- Kunsoo Park
- Thrasyvoulos N. Pappas
- Wing-Kai Hon
- Veli Mäkinen
- David L. Neuhoff
- Sang-Wook Kim
- Tak Wah Lam
- Yoshitaka Shibata
- Masayuki Takeda
- Shunsuke Inenaga
- Simon Gog
- Akihiro Miyakawa
- Bin Ma
- Krzysztof Janowicz
- Eyke Hüllermeier
- Martin Vetterli
- Hideo Bannai
- Xuemin Lin
- Mark B. Sandler
- Giovanni Manzini
- Joan Serrà
- Kaoru Sugita
- W. Graham Richards
- Tomasz Kociumaka
- Simon J. Puglisi
- Tomoyuki Ishida
- Giovanni Neglia
- Arkadii G. D'yachkov
- Chin-Chen Chang
- Sameer K. Antani
- Xin Chen
- Qi Tian
- Eneko Agirre
Venues
- CoRR
- Multim. Tools Appl.
- IEEE Access
- ISMIR
- Expert Syst. Appl.
- ICIP
- SemEval@NAACL-HLT
- ICASSP
- CogSci
- J. Chem. Inf. Comput. Sci.
- Sensors
- Neurocomputing
- CPM
- Remote. Sens.
- J. Chem. Inf. Model.
- SPIRE
- Pattern Recognit.
- Bioinform.
- Pattern Recognit. Lett.
- SISAP
- CVPR
- CIKM
- J. Intell. Fuzzy Syst.
- IEEE Trans. Knowl. Data Eng.
- BMC Bioinform.
- Theor. Comput. Sci.
- SIGIR
- Inf. Process. Manag.
- Inf. Sci.
- Appl. Math. Comput.
- IGARSS
- BIBM
- ICPR
- IEEE Trans. Multim.
- INTERSPEECH
- ICCBR
- IEICE Trans. Inf. Syst.
- IJCNN
- ICDE
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