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A New Design Flow and Testability Measure for the Generation of a Structural Test and BIST for Analogue and Mixed-Signal Circuits.
Christoph Hoffmann
Published in:
DATE (2002)
Keyphrases
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built in self test
mixed signal
vlsi circuits
multi channel
circuit design
integrated circuit
low power
high level synthesis
design process
digital circuits
similarity measure
design considerations
real time
power dissipation
cmos technology
user interface
chip design
multimedia