A Commercial Field-Programmable Dense eFUSE Array Memory with 99.999% Sense Yield for 45nm SOI CMOS.
Gregory UhlmannTony AipperspachToshiaki KirihataK. ChandrasekharanYan Zun LiChris PaoneBrian ReedNorman RobsonJohn SafranDavid SchmittSubramanian S. IyerPublished in: ISSCC (2008)
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