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Learning Robust Distance Metric with Side Information via Ratio Minimization of Orthogonally Constrained L21-Norm Distances.
Kai Liu
Lodewijk Brand
Hua Wang
Feiping Nie
Published in:
IJCAI (2019)
Keyphrases
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distance metric
distance metric learning
learning algorithm
learning process
prior knowledge
euclidean distance
image processing
pattern recognition
high dimensional
database systems
support vector
supervised learning
distance measure
metric learning