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Lifetime Prediction of Current-and Temperature-Induced Degradation in Silicone-Encapsulated 365 nm High-Power Light-Emitting Diodes.

Alexander HerzogSimon BenknerBabak ZandiMatteo BuffoloWillem D. van DrielMatteo MeneghiniTran Quoc Khanh
Published in: IEEE Access (2023)
Keyphrases
  • high power
  • light emitting diodes
  • prediction model
  • power supply
  • low power
  • artificial neural networks
  • low cost
  • high density
  • image processing