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CONCUR Test-Of-Time Award 2020 Announcement (Invited Paper).

Luca AcetoJos C. M. BaetenPatricia Bouyer-DecitreHolger HermannsAlexandra Silva
Published in: CONCUR (2020)
Keyphrases
  • invited paper
  • neural network
  • test data
  • data mining
  • information retrieval
  • test cases