Optimally mitigating BTI-induced FPGA device aging with discriminative voltage scaling (abstract only).
Yu BaiMohammed AlawadMingjie LinPublished in: FPGA (2014)
Keyphrases
- fpga device
- hardware implementation
- power system
- high level
- field programmable gate array
- semi supervised
- clock gating
- real time
- image processing
- high voltage
- feature extraction
- low level
- transmission line
- software aging
- age estimation
- power losses
- power consumption
- discriminative features
- discriminative power
- high speed
- general purpose
- case study
- neural network