Automatic Optical Inspection for Defective PCB Detection Using Transfer Learning.
Leandro H. de S. SilvaGeorge O. de A. AzevedoBruno J. T. FernandesByron L. D. BezerraEstanislau B. LimaSergio C. OliveiraPublished in: LA-CCI (2019)
Keyphrases
- transfer learning
- printed circuit boards
- knowledge transfer
- learning tasks
- labeled data
- cross domain
- active learning
- structure learning
- multi task
- reinforcement learning
- machine learning
- visual inspection
- multi task learning
- domain adaptation
- defect detection
- text mining
- collaborative filtering
- manifold alignment
- cross domain learning
- target domain
- text classification
- machine learning algorithms
- semi supervised learning
- transferring knowledge
- learning algorithm
- text categorization
- semi supervised
- previously learned
- transfer knowledge
- association rules