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Dual-Source-Line-Bias Scheme to Improve the Read Margin and Sensing Accuracy of STTRAM in Sub-90-nm Nodes.
Subho Chatterjee
Sayeef S. Salahuddin
Saibal Mukhopadhyay
Published in:
IEEE Trans. Circuits Syst. II Express Briefs (2010)
Keyphrases
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destination node
high accuracy
training set
error rate
prediction accuracy
learning algorithm
decision trees
computational complexity
computational cost
classification accuracy
sensor networks
real time
peer to peer
shortest path
information gain
graph structure
variance reduction
machine learning