A Pursuit of Superior Cost-Per-Performance in General-Purpose Linear IC Test System.

Yasutoshi Otani Eiji Ishiwa Nobuo Arai Yoshio Yamanaka

Published in: ITC (1982)

Keyphrases

general purpose
special purpose
domain specific
programming language
piecewise linear
minimum cost
testing process
neural network
high cost
information retrieval
object oriented
training set
support vector
test suite
website
expected cost
tightly coupled
machine learning