Designs for Reducing Test Time of Distributed Small Embedded SRAMs.
Baosheng WangYuejian WuAndré IvanovPublished in: DFT (2004)
Keyphrases
- cooperative
- distributed systems
- small number
- distributed environment
- distributed processing
- social networks
- multi agent
- camera network
- data sets
- agent technology
- embedded systems
- test cases
- distributed architecture
- statistical significance
- distributed computing
- design principles
- fault tolerant
- lightweight
- expert systems
- genetic algorithm
- databases