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Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability.

Minchae JungWalid SaadYoung Rok JangGyuyeol KongSooyong Choi
Published in: IEEE Wirel. Commun. Lett. (2019)
Keyphrases
  • reliability analysis
  • intelligent systems
  • cdma systems
  • condition monitoring
  • machine learning
  • data analysis
  • design process