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Defect Tolerance for Nanoscale Crossbar-Based Devices.
Mohammad Tehranipoor
Reza M. Rad
Published in:
IEEE Des. Test Comput. (2008)
Keyphrases
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mobile devices
information retrieval
embedded systems
expert systems
embedded devices
navigation systems
scheduling algorithm
low cost
three dimensional
digital libraries
neural network
database systems
case study
decision trees
handheld devices
feature selection
computer vision
automated visual inspection