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Grid-based feature distributions for off-line signature verification.

Konstantinos TseliosElias N. ZoisElias SioresAthanasios NassiopoulosGeorge Economou
Published in: IET Biom. (2012)
Keyphrases
  • feature distributions
  • similarity measure
  • feature descriptors
  • pattern recognition
  • viewpoint
  • multi class
  • dimensionality reduction