Built-In Self-Test for Low-Voltage High-Speed Analog-to-Digital Converters.
Jason WibbenmeyerChien-In Henry ChenPublished in: IEEE Trans. Instrum. Meas. (2007)
Keyphrases
- mixed signal
- low power
- high speed
- low voltage
- cmos technology
- power line
- low cost
- built in self test
- frame rate
- multi channel
- design considerations
- power consumption
- circuit design
- power management
- integrated circuit
- digital signal processing
- digital circuits
- real time
- hardware and software
- parallel processing
- response time
- data streams