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Testing of SCA Waveform Digitization ASIC for High-Precision Time Measurement.
Han Chen
Jiajun Qin
Lei Zhao
Yuting Wang
Yi Cao
Jiaming Li
Shubin Liu
Qi An
Published in:
EBCCSP (2020)
Keyphrases
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high precision
high recall
high reliability
general purpose
measurement model
test cases
cultural heritage
design methodology
high accuracy
learning algorithm
achieve high precision
integrated circuit
application specific
case study
social networks
frequency domain
decision trees
computer vision
neural network