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Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point.
Michail Noltsis
Eleni Maragkoudaki
Dimitrios Rodopoulos
Francky Catthoor
Dimitrios Soudris
Published in:
Integr. (2019)
Keyphrases
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failure rate
probability distribution
success or failure
power consumption
genetic algorithm
learning algorithm
artificial intelligence
highly reliable
failure prediction
database
microscopic images
failure modes
root cause
low power
expert systems
information systems
real world
data sets