Degradation of thin oxides during electrical stress.

Gennadi Bersuker Yongjoo Jeon Howard R. Huff

Published in: Microelectron. Reliab. (2001)

Keyphrases

transmission line
distribution networks
power grid
electrical activity
engineering and computer science
database
low voltage
computer engineering
electro mechanical
machine learning
social networks
computer vision
computational intelligence
printed circuit boards
electrical properties
stress distribution