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A Deep Learning-Based Surface Defect Inspection System Using Multiscale and Channel-Compressed Features.
Jiangxin Yang
Guizhong Fu
Wenbin Zhu
Yanlong Cao
Yanpeng Cao
Michael Ying Yang
Published in:
IEEE Trans. Instrum. Meas. (2020)
Keyphrases
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deep learning
unsupervised feature learning
multiscale
feature vectors
surface defects
co occurrence
image features
surface inspection
feature extraction
text mining
machine learning
higher order
decision makers
unsupervised learning
weakly supervised
feature space
image segmentation