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Impact of supply voltage and particle LET on the soft error rate of logic circuits.
Hui Jiang
H. Zhang
R. C. Harrington
J. A. Maharrey
J. S. Kauppila
Lloyd W. Massengill
Bharat L. Bhuva
Published in:
IRPS (2018)
Keyphrases
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error rate
logic circuits
low power
test set
lower error rates
functional decomposition
tunnel diode
word error rate
logic synthesis
misclassification rate
real time
pattern recognition
object oriented
low cost
rejection rate