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Test methodology for PCHB/PCFB Asynchronous Circuits.

Ting-Yu ShenChia-Cheng PaiTsai-Chieh ChenJames Chien-Mo LiSamuel Pan
Published in: ITC (2018)
Keyphrases
  • asynchronous circuits
  • delay insensitive
  • model checking
  • image processing
  • test data
  • statistical significance
  • database
  • learning environment
  • probabilistic model
  • conceptual model
  • design methodology
  • process algebra