The relationship between microsystem technology and metrology.

Reinoud F. Wolffenbuttel Cees J. van Mullem

Published in: IEEE Trans. Instrum. Meas. (2001)

Keyphrases

cost effective
data processing
case study
technological advances
process control
rapid development
machine learning
online learning
key technologies
single view
computer systems
mobile robot
relational databases
digital libraries
three dimensional
web services
multimedia
learning algorithm