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Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism.

Brett SparkmanScott C. SmithJia Di
Published in: J. Electron. Test. (2022)
Keyphrases
  • asynchronous circuits
  • delay insensitive
  • process algebra
  • built in self test
  • model checking
  • parallel processing
  • neural network
  • data flow