Low-sample classification in NIDS using the EC-GAN method.
Marko ZekanIgor TomicicMarkus SchattenPublished in: J. Univers. Comput. Sci. (2022)
Keyphrases
- classification method
- classification accuracy
- detection method
- support vector machine svm
- machine learning methods
- decision trees
- test data
- preprocessing
- training samples
- support vector machine
- accuracy rate
- feature set
- classification process
- pattern recognition
- classification scheme
- computational cost
- classification rate
- feature vectors
- neural network
- high accuracy
- pairwise
- support vector
- similarity measure
- training phase
- pattern classification
- supervised learning
- text classification
- cost function
- significant improvement
- artificial neural networks
- computational complexity
- image processing