Automated image analysis for electron microscopy specimen assessment.

Nicolas Coudray Jean-Luc Buessler Hubert Kihl Jean-Philippe Urban

Published in: EUSIPCO (2007)

Keyphrases

electron microscopy
automated image analysis
x ray
low energy
image stacks
image analysis
high throughput
thin film
pattern recognition
transmission electron microscopy
real time
machine learning
database systems
building blocks