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Transistor level gate modeling for accurate and fast timing, noise, and power analysis.

S. RajaF. VaradiMurat R. BecerJoao Geada
Published in: DAC (2008)
Keyphrases
  • power analysis
  • smart card
  • high speed
  • countermeasures
  • computationally efficient
  • silicon dioxide
  • leakage current