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A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits.
Congyin Shi
Sanghoon Lee
Sergio Soto Aguilar
Edgar Sánchez-Sinencio
Published in:
J. Electron. Test. (2018)
Keyphrases
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analog circuits
fault diagnosis
digital circuits
neural network
wavelet packet transform
frequency domain
real time
black box
digital curves
machine learning
computer vision
signal processing
digital objects
digital media
digital technologies