GLCM-based chi-square histogram distance for automatic detection of defects on patterned textures.
V. AshaNagappa U. BhajantriP. NagabhushanPublished in: Int. J. Comput. Vis. Robotics (2011)
Keyphrases
- automatic detection
- chi square
- gray level
- texture features
- defect detection
- logistic regression
- information gain
- texture images
- gray level co occurrence matrix
- distance measure
- kl divergence
- mutual information
- correlation coefficient
- texture analysis
- confidence intervals
- euclidean distance
- mahalanobis distance
- kullback leibler divergence
- information theoretic
- feature extraction
- distance metric
- co occurrence
- image features
- naive bayes
- text categorization
- classification accuracy
- support vector