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N determined by reflection electron energy loss spectroscopy.
Harvi Alirio Castillo
Alfonso Devia
Gerardo Soto
Jesús A. Díaz
Wencel De La Cruz
Published in:
Microelectron. J. (2008)
Keyphrases
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electron microscopy
low energy
x ray
high energy
minimum energy
infrared
energy consumption
real time
electron beam
search engine
single image
multiscale
energy minimization
energy efficiency
energy efficient
thin film
three dimensional
machine learning
data sets