Binary Difference Based Test Data Compression for NoC Based SoCs.

Sanga Chaki Chandan Giri Hafizur Rahaman

Published in: ISVLSI (2012)

Keyphrases

test data
training data
test set
test cases
data sets
training set
image compression
multi processor
training and test data
genetic algorithm
learning algorithm
database systems
reinforcement learning
pairwise
evolutionary algorithm