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An embedded technique for at-speed interconnect testing.

Benoit Nadeau-DostieJean-Francois CoteHarry HulvershornStephen Pateras
Published in: ITC (1999)
Keyphrases
  • high speed
  • real time
  • embedded systems
  • website
  • face recognition
  • processing speed
  • decision making
  • knowledge base
  • image segmentation
  • relational databases
  • test data
  • power dissipation