A test vector selection method based on machine learning for efficient presilicon verification.
Hyeong Gu LimJaeyeon JangByung Kook JuJae-Wook KoChang Ouk KimPublished in: Expert Syst. Appl. (2023)
Keyphrases
- machine learning
- machine learning methods
- high accuracy
- preprocessing
- pattern recognition
- high efficiency
- selection algorithm
- test data
- dynamic programming
- detection method
- computational cost
- probabilistic model
- computationally efficient
- mutual information
- clustering method
- data sets
- significant improvement
- edge detection
- objective function
- information extraction
- experimental evaluation
- error rate
- synthetic data
- high precision
- feature selection
- face recognition
- highly efficient
- computational complexity
- sparse matrix