A Non-Blocking Non-Degrading Multiple Defects Link Testing Method for 3D-Networks-on-Chip.
Khanh N. DangMichael Conrad MeyerAkram Ben AhmedAbderazek Ben AbdallahXuan-Tu TranPublished in: IEEE Access (2020)
Keyphrases
- high accuracy
- high precision
- cost function
- experimental evaluation
- synthetic data
- optimization algorithm
- low cost
- detection method
- clustering method
- model selection
- dynamic programming
- significant improvement
- similarity measure
- web pages
- input data
- support vector machine svm
- prior knowledge
- pairwise
- preprocessing
- classification method