Memory effects in EM emission during uniaxial deformation of dielectric Crystalline materials.
Vassilios HadjicontisGeorge S. TombrasDimitrios NinosClairi MavromatouPublished in: IEEE Geosci. Remote. Sens. Lett. (2005)
Keyphrases
- thin film
- room temperature
- expectation maximization
- em algorithm
- chemical vapor deposition
- image registration
- memory requirements
- memory space
- deformable objects
- random access
- high density
- associative memory
- materials science
- individual differences
- computing power
- image segmentation
- learning materials
- gaussian mixture model
- generative model
- low cost
- probabilistic model
- bayesian networks