Classification of run-length encoded binary data.
T. Ravindra BabuM. Narasimha MurtyVijay K. AgrawalPublished in: Pattern Recognit. (2007)
Keyphrases
- run length
- binary data
- gray level
- feature vectors
- classification accuracy
- machine learning
- sample size
- pattern recognition
- decision trees
- feature space
- supervised learning
- data hiding
- data structure
- feature set
- image classification
- high dimensional
- data sets
- rough sets
- model selection
- itemsets
- data analysis
- classification algorithm
- classification rules
- texture information
- feature extraction
- feature selection
- data mining