Test Scheduling and Test Time Minimization of System-on-Chip Using Modified BAT Algorithm.
Gokul ChandrasekaranNeelam Sanjeev KumarKarthikeyan Panjappagounder RajamanickamVanchinathan KumarasamyNeeraj PriyadarshiBhekisipho TwalaPublished in: IEEE Access (2022)
Keyphrases
- objective function
- improved algorithm
- cost function
- times faster
- preprocessing
- convergence rate
- dynamic programming
- input data
- learning algorithm
- statistical hypothesis testing
- hardware implementation
- recognition algorithm
- tree structure
- theoretical analysis
- experimental evaluation
- np hard
- significant improvement
- k means
- search space
- computational complexity
- video sequences
- worst case
- high accuracy
- computational cost
- test cases
- matching algorithm
- scheduling algorithm
- hardware and software
- data sets