Gokul Chandrasekaran

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 7

Top Topics

Mathematical Formulation

Firefly Algorithm

Scheduling Problem

Top Venues

J. Intell. Fuzzy Syst.

Int. J. Syst. Assur. Eng. Manag.

Rev. d'Intelligence Artif.

Neural Comput. Appl.

Publications

Jayakumar Thangavel, Gnanavel Chinnaraj, Gokul Chandrasekaran, Vanchinathan Kumarasamy
Design and development of solar photovoltaic fed modular multilevel inverter using intelligent techniques for renewable energy applications. J. Intell. Fuzzy Syst. 44 (2) (2023)
Vanchinathan Kumarasamy, Valluvan KarumanchettyThottam Ramasamy, Gokul Chandrasekaran, Gnanavel Chinnaraj, Padhmanabhaiyappan Sivalingam, Neelam Sanjeev Kumar
A review of integer order PID and fractional order PID controllers using optimization techniques for speed control of brushless DC motor drive. Int. J. Syst. Assur. Eng. Manag. 14 (4) (2023)
Gnanavel Chinnaraj, Vanchinathan Kumarasamy, Muthukumar Paramasivan, Gokul Chandrasekaran, Neelam Sanjeev Kumar
Mathematical formulation of multicarrier PWM techniques and design an eleven-level modular multilevel inverter to improve power quality. Int. J. Syst. Assur. Eng. Manag. 14 (4) (2023)
Gokul Chandrasekaran, Neelam Sanjeev Kumar, Karthikeyan Panjappagounder Rajamanickam, Vanchinathan Kumarasamy, Neeraj Priyadarshi, Bhekisipho Twala
Test Scheduling and Test Time Minimization of System-on-Chip Using Modified BAT Algorithm. IEEE Access 10 (2022)
Gokul Chandrasekaran, Karthikeyan Panjappagounder Rajamanickam, Neelam Sanjeev Kumar, Vanchinathan Kumarasamy
Test scheduling of System-on-Chip using Dragonfly and Ant Lion optimization algorithms. J. Intell. Fuzzy Syst. 40 (3) (2021)
Gokul Chandrasekaran, Gopinath Singaram, Rajkumar Duraisamy, Akash Sanjay Ghodake, Parthiban Kunnathur Ganesan
Test Scheduling and Test Time Reduction for SoC by Using Enhanced Firefly Algorithm. Rev. d'Intelligence Artif. 35 (3) (2021)
Gokul Chandrasekaran, Sakthivel Periyasamy, Karthikeyan Panjappagounder Rajamanickam
Minimization of test time in system on chip using artificial intelligence-based test scheduling techniques. Neural Comput. Appl. 32 (9) (2020)