YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in Industrial Manufacturing Field.
Ziqiang LiuKejiang YePublished in: METAVERSE (2023)
Keyphrases
- learning algorithm
- cost function
- experimental evaluation
- detection algorithm
- preprocessing
- dynamic programming
- high accuracy
- neural network
- computational complexity
- optimization algorithm
- defect detection
- segmentation algorithm
- np hard
- k means
- optimal solution
- probabilistic model
- computational cost
- expectation maximization
- search algorithm
- range data
- recognition algorithm
- surface reconstruction
- distance transform