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Robust Built-In Test of RF ICs Using Envelope Detectors.
Donghoon Han
Abhijit Chatterjee
Published in:
Asian Test Symposium (2005)
Keyphrases
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object detection
computationally efficient
genetic algorithm
active learning
wireless sensor networks
relevance feedback
real time
computer vision
neural network
machine learning
bayesian networks
object recognition
test cases
test suite